diff --git a/contributed_definitions/NXbeam_device.nxdl.xml b/contributed_definitions/NXbeam_device.nxdl.xml index ee798485f9..83a38594a1 100644 --- a/contributed_definitions/NXbeam_device.nxdl.xml +++ b/contributed_definitions/NXbeam_device.nxdl.xml @@ -21,6 +21,9 @@ # # For further information, see http://www.nexusformat.org --> + Properties of generic beam device in an experimental setup. @@ -55,6 +58,14 @@ Is used for simplified setup vizualization (or description?). + + + Link to the NeXus device like a NXdetector, a NXmonochromator or NXsource. + + For example: + @device: 'entry/instrument/laser_source' + + Location and orientation of the device. Note that even a diff --git a/contributed_definitions/NXopt.nxdl.xml b/contributed_definitions/NXopt.nxdl.xml index 570d18555e..766b086e12 100644 --- a/contributed_definitions/NXopt.nxdl.xml +++ b/contributed_definitions/NXopt.nxdl.xml @@ -1,10 +1,10 @@ - + - - - + Variables used throughout the document, e.g. dimensions or parameters. @@ -277,18 +279,12 @@ optical spectroscopy experiments--> - + + + + - Describes an arrangement of optical or other elements, e.g. the beam - path between the light source and the sample, or between the sample - and the detector unit (including the sources and detectors - themselves). - - If a beam splitter (i.e. a device that splits the incoming beam into - two or more beams) is part of the beam path, two or more NXbeam_path - fields may be needed to fully describe the beam paths and the correct - sequence of the beam path elements. - Use as many beam paths as needed to describe the setup. + Beam characteristics between two beam_devices. diff --git a/contributed_definitions/NXraman.nxdl.xml b/contributed_definitions/NXraman.nxdl.xml new file mode 100644 index 0000000000..62af127503 --- /dev/null +++ b/contributed_definitions/NXraman.nxdl.xml @@ -0,0 +1,609 @@ + + + + + + + + + + Variables used throughout the document, e.g. dimensions or parameters. + + + + Length of the spectrum array (e.g. wavelength or energy) of the measured + data. + + + + + Number of sensors used to measure parameters that influence the sample, + such as temperature or pressure. + + + + + Number of measurements (1st dimension of measured_data array). This is + equal to the number of parameters scanned. For example, if the experiment + was performed at three different temperatures and two different pressures + N_measurements = 2*3 = 6. + + + + + Number of scattering configurations used in the measurement. + It is 1 for only parallel polarization meausement, 2 for parallel and cross + polarization measurement or larger, if i.e. the incident and scattered photon + direction is varied. + + + + + Number of observables that are saved in a measurement. e.g. one for + intensity, reflectivity or transmittance, two for Psi and Delta etc. This + is equal to the second dimension of the data array 'measured_data' and the + number of column names. + + + + + Number of time points measured, the length of NXsample/time_points + + + + + Number of points for a spectral filter used in the setup + + + + + An application definition for Raman spectrocopy experiments. + + Information on Raman spectroscopy are provided in: + + General + + * Lewis, Ian R.; Edwards, Howell G. M. + Handbook of Raman Spectroscopy + ISBN 0-8247-0557-2 + + Raman scattering selection rules + + * Dresselhaus, M. S.; Dresselhaus, G.; Jorio, A. + Group Theory - Application to the Physics ofCondensed Matter + ISBN 3540328971 + + Semiconductors + + * Manuel Cardona + Light Scattering in Solids I + eBook ISBN: 978-3-540-37568-5 + DOI: https://doi.org/10.1007/978-3-540-37568-5 + + * Manuel Cardona, Gernot Güntherodt + Light Scattering in Solids II + eBook ISBN: 978-3-540-39075-6 + DOI: https://doi.org/10.1007/3-540-11380-0 + + * See as well other Books from the "Light Scattering in Solids" series: + III: Recent Results + IV: Electronic Scattering, Spin Effects, SERS, and Morphic Effects + V: Superlattices and Other Microstructures + VI: Recent Results, Including High-Tc Superconductivity + VII: Crystal-Field and Magnetic Excitations + VIII: Fullerenes, Semiconductor Surfaces, Coherent Phonons + IX: Novel Materials and Techniques + + Glasses, Liquids, Gasses, ... + + Review articles: + Stimulated Raman scattering, Coherent anti-Stokes Raman scattering, + Surface-enhanced Raman scattering, Tip-enhanced Raman scattering + * https://doi.org/10.1186/s11671-019-3039-2 + + + + This is the application definition describing Raman spectroscopy experiments. + + Such experiments may be as simple a single Raman spectrum from spontanous + Raman scattering and range to Raman imaging Raman spectrometer, + surface- and tip-enhanced Raman techniques, x-Ray Raman scattering, as well + as resonant Raman scattering phenomena or multidimenional Raman spectra (i.e. + varying temperature, pressure, electric field, ....) + + The application definition defines: + + * elements of the experimental instrument + * calibration information if available + * parameters used to tune the state of the sample + * sample description + + + + An application definition for Raman spectrsocopy. + + + + Version number to identify which definition of this application + definition was used for this entry/data. + + + + + URL where to find further material (documentation, examples) relevant + to the application definition. + + + + + + + + + An optional free-text description of the experiment. + + However, details of the experiment should be defined in the specific + fields of this application definition rather than in this experiment + description. + + + + + Specify the type of Raman measurement. + + + + + + + + + + + + + + + + + + + If the experiment_type is `other`, a name should be specified here. + + + + + Metadata of the setup, its optical elements and physical properites which + defines the Raman measurement. + + + + Name of the company which build the instrument. + + + + + + + + ISO8601 date when the instrument was constructed. + UTC offset should be specified. + + + + + + Commercial or otherwise defined given name of the program that was + used to generate the result file(s) with measured data and metadata. + This program converts the measured signals to Raman data. If + home written, one can provide the actual steps in the NOTE subfield + here. + + + + + + Which wavelength the incident beam has, e.g. a single wavelength for a laser source. + For multiple excitation wavelengths, please state the specific discret + wavelengths (i.e. for dye laser) or the specific contnious range + (i.e for white light laser source). + + + + + Scattering configuration as defined by the porto notation by three + states, which are othogonal to each other. Example: z(xx)z for + parallel polarized backscattering configuration. + + See: + https://www.cryst.ehu.es/cgi-bin/cryst/programs/nph-doc-raman + + A(BC)D + + A = The propagation direction of the incident light (k_i) + B = The polarization direction of the incident light (E_i) + C = The polarization direction of the scattered light (E_s) + D = The propagation direction of the scattered light (k_s) + + An orthogonal base is assumed. + Linear polarized light is displayed by e.g. "x","y" or "z" + Unpolarized light is displayed by "." + For non-orthogonal vectors, use the attribute porto_notation_vectors. + + + + + Scattering configuration as defined by the porto notation given by + respective vectors. + + Vectors in the porto notation are defined as for A, B, C, D above. + Linear light polarization is assumed. + + + + 3 x 4 Matrix, which lists the porto notation vectors A, B, C, D. + A has to be perpendicular to B and C perpendicular to D. + + + + + + + + + + This is the beam device instance of the optical source. + + It enables a description of the optical setup via NXbeam_devices to + be able to connect the components. This connection is then a "beam path". + + The properties of the source are located in a NXsource group. + [Note: the idea is to incorporate later NXbeam_device into NXsource] + + This is done similarily with NXlens_opt, NXdetector, NXwaveplate and NXmonochromator. + + + + It should contain the name of the Nexus source group. + + + + + + Beam device instance of the incident light optics. + + + + It should contain the name of the "incident_light_lens(NXlens_opt)" group + + + + + + Beam device instance of the scattered light optics. + + + + It should contain the name of the "scattered_light_lens(NXlens_opt)" group + + + + + + Properties of the detector to link it via NXbeam_device to other beam + elements + + + + It should contain the name of the Nexus detector group + + + + + + Link to the device, that it can be used to generate a beam path via + NXbeam_device. The string >NAME< in the name of this NXbeam_device + has to identical to >NAME< in waveplate_NAME(NXwaveplate). + + + + This should contain the name for each halfwave plate used in the + NXwaveplate group. + + + + + + Dispersive element to create e.g. an energetic resolution used in the + measurement. + + + + It should contain the name of the Nexus Monochromator group + + + + + + Enables beam path description of the sample in the setup. + it in a beam path. + + + + Contains the link to the sample. + + + + + + + Light source with arbitrary choice of name. This shall be referenced + by source(NXbeam_device) + + + + + + + + + + + + The type of light polarization procuded by the source. + + + + + + + + + + + + Details about the specific device information if available. + + + + + + Detector with arbitrary choice of the name, which shall be referenced + by the detector(NXbeam_device). + + + + Details about the specific device information if available. + + + + + Select which type of data was recorded, for example a simple spectrum + with intensity vs. Raman shift, CCD image or a set of spectra with + probe, reference and background signals for pump beam on and off. + + + + + + + + + + + Monochromator with arbitrary choice of the name, which shall be referenced + by the spectrometer(NXbeam_device). + + + + Details about the specific device information if available. + + + + + + + This is the optical element used to focus the incident light in the + Raman scattering process. + + This can be for example a simple lens or microscope objective. + + + + + + + + + + + + + The numerical aperture of the used incident light optics. + + + + + Magnification of the lens. + + + + + Details about the optical component, if available. + + + + + + This is the optical element used to collect the scattered light in the + Raman scattering process. + + This can be for example a simple lens or microscope objective. + + + + + + + + + + + + + The numerical aperture of the used incident light optics. + + + + + Magnification of the lens. + + + + + Details about the optical component, if available. + + + + + + Properties of a wave plate to manipulate the polarization state of light. + + + + Details about the optical component, if available. + + + + + + + + Physical principle of the polarization filter used to create a + defined incident or scattered light state. + + + + + + + + + + + + Specific name or type of the polarizer used. + + Free text, for example: Glan-Thompson, Glan-Taylor, Rochon Prism, Wollaston + Polarizer... + + + + + Details about the optical component, if available. + + + + + + Spectral filter used to modify properties of the scattered or incident light. + + + + Type of laserline filter used to supress the laser, if measurements + close to the laserline are performed. + + + + + + + + + + + + + Type of laserline filter used to supress the laser, if measurements + close to the laserline are performed. + + + + + + + + + + + + Properties of the spectral filter such as wavelength dependent Transmission + or reflectivity. + + + + + + + + + Which property is used to form the spectral properties of light, + i.e. transmission or reflection properties. + + + + + + + + + + Details about the optical component, if available. + + + + + + + + + + + diff --git a/contributed_definitions/nyaml/NXbeam_device.yaml b/contributed_definitions/nyaml/NXbeam_device.yaml index 3af998a41e..55e7ba4fff 100644 --- a/contributed_definitions/nyaml/NXbeam_device.yaml +++ b/contributed_definitions/nyaml/NXbeam_device.yaml @@ -7,6 +7,9 @@ doc: | can be described here with its experimental position and relationship to the other beam devices in the setup. +# This beam device properites shall later be integrated into NXsource, NXdetector, etc +# i.e. each different beam device. + NXbeam_device(NXobject): @@ -31,6 +34,15 @@ NXbeam_device(NXobject): all these devices have the group name "second harmonic generation". Is used for simplified setup vizualization (or description?). + \@device: + type: NX_CHAR + exists: recommended + doc: | + Link to the NeXus device like a NXdetector, a NXmonochromator or NXsource. + + For example: + @device: 'entry/instrument/laser_source' + (NXtransformations): doc: | diff --git a/contributed_definitions/nyaml/NXopt.yaml b/contributed_definitions/nyaml/NXopt.yaml index 777076ff78..6bae01d051 100644 --- a/contributed_definitions/nyaml/NXopt.yaml +++ b/contributed_definitions/nyaml/NXopt.yaml @@ -182,18 +182,13 @@ NXopt(NXobject): calibration_data_link: doc: | Link to the NeXus file containing the calibration data and metadata. - (NXbeam_path): + (NXbeam_device): + exists: recommended + previous_devices: + (NXbeam): + exists: optional doc: | - Describes an arrangement of optical or other elements, e.g. the beam - path between the light source and the sample, or between the sample - and the detector unit (including the sources and detectors - themselves). - - If a beam splitter (i.e. a device that splits the incoming beam into - two or more beams) is part of the beam path, two or more NXbeam_path - fields may be needed to fully describe the beam paths and the correct - sequence of the beam path elements. - Use as many beam paths as needed to describe the setup. + Beam characteristics between two beam_devices. angle_of_incidence(NX_NUMBER): unit: NX_ANGLE doc: | diff --git a/contributed_definitions/nyaml/NXraman.yaml b/contributed_definitions/nyaml/NXraman.yaml new file mode 100644 index 0000000000..7d5cfc6668 --- /dev/null +++ b/contributed_definitions/nyaml/NXraman.yaml @@ -0,0 +1,839 @@ +category: application +doc: | + An application definition for Raman spectrocopy experiments. + + Information on Raman spectroscopy are provided in: + + General + + * Lewis, Ian R.; Edwards, Howell G. M. + Handbook of Raman Spectroscopy + ISBN 0-8247-0557-2 + + Raman scattering selection rules + + * Dresselhaus, M. S.; Dresselhaus, G.; Jorio, A. + Group Theory - Application to the Physics ofCondensed Matter + ISBN 3540328971 + + Semiconductors + + * Manuel Cardona + Light Scattering in Solids I + eBook ISBN: 978-3-540-37568-5 + DOI: https://doi.org/10.1007/978-3-540-37568-5 + + * Manuel Cardona, Gernot Güntherodt + Light Scattering in Solids II + eBook ISBN: 978-3-540-39075-6 + DOI: https://doi.org/10.1007/3-540-11380-0 + + * See as well other Books from the "Light Scattering in Solids" series: + III: Recent Results + IV: Electronic Scattering, Spin Effects, SERS, and Morphic Effects + V: Superlattices and Other Microstructures + VI: Recent Results, Including High-Tc Superconductivity + VII: Crystal-Field and Magnetic Excitations + VIII: Fullerenes, Semiconductor Surfaces, Coherent Phonons + IX: Novel Materials and Techniques + + Glasses, Liquids, Gasses, ... + + Review articles: + Stimulated Raman scattering, Coherent anti-Stokes Raman scattering, + Surface-enhanced Raman scattering, Tip-enhanced Raman scattering + * https://doi.org/10.1186/s11671-019-3039-2 +symbols: + doc: | + Variables used throughout the document, e.g. dimensions or parameters. + N_spectrum: | + Length of the spectrum array (e.g. wavelength or energy) of the measured + data. + N_sensors: | + Number of sensors used to measure parameters that influence the sample, + such as temperature or pressure. + N_measurements: | + Number of measurements (1st dimension of measured_data array). This is + equal to the number of parameters scanned. For example, if the experiment + was performed at three different temperatures and two different pressures + N_measurements = 2*3 = 6. + N_scattering_configurations: | + Number of scattering configurations used in the measurement. + It is 1 for only parallel polarization meausement, 2 for parallel and cross + polarization measurement or larger, if i.e. the incident and scattered photon + direction is varied. + N_observables: | + Number of observables that are saved in a measurement. e.g. one for + intensity, reflectivity or transmittance, two for Psi and Delta etc. This + is equal to the second dimension of the data array 'measured_data' and the + number of column names. + N_time: | + Number of time points measured, the length of NXsample/time_points + N_spectrum_filter: | + Number of points for a spectral filter used in the setup + + #N_incident_wavelengths: | + # Number of the incident wavelen + #N_incident_beams: | + # to be done.... + +# 04/2024 +# A draft version of a NeXus application definition for Raman spectroscopy. + +# The document has the following main elements: +# - Instrument used and is characteristics +# - Sample: Properties of the sample +# - Data: measured data, data errors +# - Derived parameters: e.g. extra parameters derived in the measurement software +type: group +NXraman(NXopt): + (NXentry): + doc: | + This is the application definition describing Raman spectroscopy experiments. + + Such experiments may be as simple a single Raman spectrum from spontanous + Raman scattering and range to Raman imaging Raman spectrometer, + surface- and tip-enhanced Raman techniques, x-Ray Raman scattering, as well + as resonant Raman scattering phenomena or multidimenional Raman spectra (i.e. + varying temperature, pressure, electric field, ....) + + The application definition defines: + + * elements of the experimental instrument + * calibration information if available + * parameters used to tune the state of the sample + * sample description + definition: + doc: | + An application definition for Raman spectrsocopy. + \@version: + doc: | + Version number to identify which definition of this application + definition was used for this entry/data. + \@url: + doc: | + URL where to find further material (documentation, examples) relevant + to the application definition. + enumeration: [NXraman] + experiment_description: + exists: optional + doc: | + An optional free-text description of the experiment. + + However, details of the experiment should be defined in the specific + fields of this application definition rather than in this experiment + description. + experiment_type: + doc: | + Specify the type of Raman measurement. + enumeration: [in situ Raman spectroscopy, resonant Raman spectroscopy, non-resonant Raman spectroscopy, Raman imaging, Tip-enhanced Raman spectroscopy (TERS), Surface-enhanced Raman spectroscopy (SERS), Surface plasmon polariton enhanced Raman scattering (SPPERS), Hyper Raman spectroscopy (HRS), Stimulated Raman spectroscopy (SRS), Inverse Raman spectroscopy (IRS), Coherent anti-Stokes Raman spectroscopy (CARS), other] + experiment_type_other: + exists: optional + doc: | + If the experiment_type is `other`, a name should be specified here. + (NXinstrument): + doc: | + Metadata of the setup, its optical elements and physical properites which + defines the Raman measurement. + device_information(NXfabrication): + doc: | + Name of the company which build the instrument. + exists: recommended + vendor: + exists: recommended + model: + exists: recommended + identifier: + exists: recommended + construction_year(NX_DATE_TIME): + exists: optional + doc: | + ISO8601 date when the instrument was constructed. + UTC offset should be specified. + software(NXfabrication): + exists: recommended + program_name: + doc: | + Commercial or otherwise defined given name of the program that was + used to generate the result file(s) with measured data and metadata. + This program converts the measured signals to Raman data. If + home written, one can provide the actual steps in the NOTE subfield + here. + incident_beam_wavelength(NX_NUMBER): + unit: NX_WAVELENGTH + doc: | + Which wavelength the incident beam has, e.g. a single wavelength for a laser source. + For multiple excitation wavelengths, please state the specific discret + wavelengths (i.e. for dye laser) or the specific contnious range + (i.e for white light laser source). + scattering_configuration(NX_CHAR): + doc: | + Scattering configuration as defined by the porto notation by three + states, which are othogonal to each other. Example: z(xx)z for + parallel polarized backscattering configuration. + + See: + https://www.cryst.ehu.es/cgi-bin/cryst/programs/nph-doc-raman + + A(BC)D + + A = The propagation direction of the incident light (k_i) + B = The polarization direction of the incident light (E_i) + C = The polarization direction of the scattered light (E_s) + D = The propagation direction of the scattered light (k_s) + + An orthogonal base is assumed. + Linear polarized light is displayed by e.g. "x","y" or "z" + Unpolarized light is displayed by "." + For non-orthogonal vectors, use the attribute porto_notation_vectors. + \@porto_notation_vectors(NX_NUMBER): + # unit: NX_LENGTH + doc: | + Scattering configuration as defined by the porto notation given by + respective vectors. + + Vectors in the porto notation are defined as for A, B, C, D above. + Linear light polarization is assumed. + dimensions: + rank: 2 + doc: | + 3 x 4 Matrix, which lists the porto notation vectors A, B, C, D. + A has to be perpendicular to B and C perpendicular to D. + dim: [[1, 4], [2, 3]] + + # In the following - Auxillary NXbeam_devices are defined, to enable a + # beam path description of the setup, while using the up now available + # Nexus definitions for source, detector, monochromator, ... + opt_source(NXbeam_device): + exists: optional + doc: | + This is the beam device instance of the optical source. + + It enables a description of the optical setup via NXbeam_devices to + be able to connect the components. This connection is then a "beam path". + + The properties of the source are located in a NXsource group. + [Note: the idea is to incorporate later NXbeam_device into NXsource] + + This is done similarily with NXlens_opt, NXdetector, NXwaveplate and NXmonochromator. + \@device: + doc: | + It should contain the name of the Nexus source group. + incident_light_optics(NXbeam_device): + exists: optional + doc: | + Beam device instance of the incident light optics. + \@device: + doc: | + It should contain the name of the "incident_light_lens(NXlens_opt)" group + scattered_light_optics(NXbeam_device): + exists: optional + doc: | + Beam device instance of the scattered light optics. + \@device: + doc: | + It should contain the name of the "scattered_light_lens(NXlens_opt)" group + opt_detector(NXbeam_device): + exists: optional + doc: | + Properties of the detector to link it via NXbeam_device to other beam + elements + \@device: + doc: | + It should contain the name of the Nexus detector group + polarization_manipulator_NAME(NXbeam_device): + exists: optional + doc: | + Link to the device, that it can be used to generate a beam path via + NXbeam_device. The string >NAME< in the name of this NXbeam_device + has to identical to >NAME< in waveplate_NAME(NXwaveplate). + \@device: + doc: | + This should contain the name for each halfwave plate used in the + NXwaveplate group. + opt_monochromator(NXbeam_device): + exists: optional + doc: | + Dispersive element to create e.g. an energetic resolution used in the + measurement. + \@device: + doc: | + It should contain the name of the Nexus Monochromator group + sample_as_beam_element(NXbeam_device): + exists: optional + doc: | + Enables beam path description of the sample in the setup. + it in a beam path. + \@device: + doc: | + Contains the link to the sample. + + # Below: generic NeXus definition for optical elements of the setup + (NXsource): + doc: | + Light source with arbitrary choice of name. This shall be referenced + by source(NXbeam_device) + source_type: + enumeration: [laser, dye-laser, broadband tunable light source, other] + source_polarization: + doc: | + The type of light polarization procuded by the source. + enumeration: [linear, unpolarized, circular, elliptically, other] + device_information(NXfabrication): + doc: | + Details about the specific device information if available. + (NXdetector): + doc: | + Detector with arbitrary choice of the name, which shall be referenced + by the detector(NXbeam_device). + device_information(NXfabrication): + doc: | + Details about the specific device information if available. + data_type: + exists: optional + doc: | + Select which type of data was recorded, for example a simple spectrum + with intensity vs. Raman shift, CCD image or a set of spectra with + probe, reference and background signals for pump beam on and off. + enumeration: [Integrated single spectrum, CCD image, Probe + Background + Reference for Pump-on and Pump-off (i.e. for FSRS)] + (NXmonochromator): + exists: optional + doc: | + Monochromator with arbitrary choice of the name, which shall be referenced + by the spectrometer(NXbeam_device). + device_information(NXfabrication): + doc: | + Details about the specific device information if available. + + # Below: + # NeXus definition derived optical elements of the setup + incident_light_lens(NXlens_opt): + doc: | + This is the optical element used to focus the incident light in the + Raman scattering process. + + This can be for example a simple lens or microscope objective. + exists: optional + type: + enumeration: [objective, lens, glass fiber, none, other] + numerical_aperture(NX_NUMBER): + doc: | + The numerical aperture of the used incident light optics. + magnification: + doc: | + Magnification of the lens. + device_information(NXfabrication): + doc: | + Details about the optical component, if available. + scattered_light_lens(NXlens_opt): + doc: | + This is the optical element used to collect the scattered light in the + Raman scattering process. + + This can be for example a simple lens or microscope objective. + exists: optional + type: + enumeration: [objective, lens, glass fiber, none, other] + numerical_aperture(NX_NUMBER): + doc: | + The numerical aperture of the used incident light optics. + magnification: + doc: | + Magnification of the lens. + device_information(NXfabrication): + doc: | + Details about the optical component, if available. + waveplate_N(NXwaveplate): + exists: optional + doc: | + Properties of a wave plate to manipulate the polarization state of light. + device_information(NXfabrication): + doc: | + Details about the optical component, if available. + + # Below: NXraman specific optical elements + polarization_filter(NXbeam_device): + exists: optional + filter_mechanism(NX_CHAR): + exists: optional + doc: | + Physical principle of the polarization filter used to create a + defined incident or scattered light state. + enumeration: [Polarization by Fresnel reflection, Birefringent polarizers, Thin film polarizers, Wire-grid polarizers, other] + specific_polarization_filter_type(NX_CHAR): + exists: optional + doc: | + Specific name or type of the polarizer used. + + Free text, for example: Glan-Thompson, Glan-Taylor, Rochon Prism, Wollaston + Polarizer... + device_information(NXfabrication): + doc: | + Details about the optical component, if available. + spectral_filter_N(NXbeam_device): + exists: optional + doc: | + Spectral filter used to modify properties of the scattered or incident light. + filter_type: + exists: optional + doc: | + Type of laserline filter used to supress the laser, if measurements + close to the laserline are performed. + enumeration: [long-pass filter, short-pass filter, Notch filter, reflection filter, neutral density filter, other] + intended_use: + exists: optional + doc: | + Type of laserline filter used to supress the laser, if measurements + close to the laserline are performed. + enumeration: [laser line cleanup, raylight line removal, spectral filtering, intensity manipulation, other] + filter_characteristics(NX_NUMBER): + exists: optional + doc: | + Properties of the spectral filter such as wavelength dependent Transmission + or reflectivity. + dimensions: + rank: 2 + dim: [[1, 2], [2, N_spectrum_filter]] + # 2 -> [Wavelength, Transmission] + # N_spectrum_filter --> Number of wavelengths + \@characteristics_type: + exists: optional + doc: | + Which property is used to form the spectral properties of light, + i.e. transmission or reflection properties. + enumeration: [transmission, reflection] + device_information(NXfabrication): + doc: | + Details about the optical component, if available. + (NXsample): + name: + exists: required + sample_id: + exists: recommended + chemical_formula: + exists: recommended + +# ++++++++++++++++++++++++++++++++++ SHA HASH ++++++++++++++++++++++++++++++++++ +# 80b03b96b60b3c124d11d834654b3e57e09716088e8dca121f7903148c7b06e3 +# +# +# +# +# +# +# +# +# Variables used throughout the document, e.g. dimensions or parameters. +# +# +# +# An application definition for Raman spectrocopy experiments. +# +# Information on Raman spectroscopy are provided in: +# +# General +# * Lewis, Ian R.; Edwards, Howell G. M. +# Handbook of Raman Spectroscopy +# ISBN 0-8247-0557-2 +# +# Raman scattering selection rules +# * Dresselhaus, M. S.; Dresselhaus, G.; Jorio, A. +# Group Theory - Application to the Physics ofCondensed Matter +# ISBN 3540328971 +# +# Semiconductors +# * Manuel Cardona +# Light Scattering in Solids I +# eBook ISBN: 978-3-540-37568-5 +# DOI: https://doi.org/10.1007/978-3-540-37568-5 +# +# * Manuel Cardona, Gernot Güntherodt +# Light Scattering in Solids II +# eBook ISBN: 978-3-540-39075-6 +# DOI: https://doi.org/10.1007/3-540-11380-0 +# +# * See as well other Books from the "Light Scattering in Solids" series: +# III: Recent Results +# IV: Electronic Scattering, Spin Effects, SERS, and Morphic Effects +# V: Superlattices and Other Microstructures +# VI: Recent Results, Including High-Tc Superconductivity +# VII: Crystal-Field and Magnetic Excitations +# VIII: Fullerenes, Semiconductor Surfaces, Coherent Phonons +# IX: Novel Materials and Techniques +# +# Glasses, Liquids, Gasses, ... +# +# Review articles: +# Stimulated Raman scattering, Coherent anti-Stokes Raman scattering, +# Surface-enhanced Raman scattering, Tip-enhanced Raman scattering +# * https://doi.org/10.1186/s11671-019-3039-2 +# +# +# +# This is the application definition describing Raman spectroscopy experiments. +# +# Such experiments may be as simple a single Raman spectrum from spontanous +# Raman scattering and range to Raman imaging Raman spectrometer, +# surface- and tip-enhanced Raman techniques, x-Ray Raman scattering, as well +# as resonant Raman scattering phenomena or multidimenional Raman spectra (i.e. +# varying temperature, pressure, electric field, ....) +# +# The application definition defines: +# +# * elements of the experimental instrument +# * calibration information if available +# * parameters used to tune the state of the sample +# * sample description +# +# +# +# An application definition for ellipsometry. +# +# +# +# Version number to identify which definition of this application +# definition was used for this entry/data. +# +# +# +# +# URL where to find further material (documentation, examples) relevant +# to the application definition. +# +# +# +# +# +# +# +# +# An optional free-text description of the experiment. +# +# However, details of the experiment should be defined in the specific +# fields of this application definition rather than in this experiment +# description. +# +# +# +# +# Specify the type of Raman measurement. +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# +# Properties of the Instruments used for Raman instrumeasurements. +# +# +# +# Name of the company which build the instrument. +# +# +# +# +# ISO8601 date when the instrument was constructed. +# UTC offset should be specified. +# +# +# +# +# +# Commercial or otherwise defined given name of the program that was +# used to generate the result file(s) with measured data and metadata. +# This program converts the measured signals to Raman data. If +# home written, one can provide the actual steps in the NOTE subfield +# here. +# +# +# +# +# +# Which indicent wavelength was used for e.g. a laser source. +# For multiple excitation wavelengths, please state the specific discret +# wavelengths (i.e. for dye laser) or the specific contnious range +# (i.e for white light laser source) +# +# +# +# +# +# Scattering configuration as defined by the porto notation by three +# states, which are othogonal to each other. Example: z(xx)z for +# parallel polarized backscattering configuration. +# +# See: +# https://www.cryst.ehu.es/cgi-bin/cryst/programs/nph-doc-raman +# +# A(BC)D +# +# A = The propagation direction of the incident light (k_i) +# B = The polarization direction of the incident light (E_i) +# C = The polarization direction of the scattered light (E_s) +# D = The propagation direction of the scattered light (k_s) +# +# An orthogonal base is assumed. +# Linear polarized light is displayed by e.g. "x","y" or "z" +# Unpolarized light is displayed by "." +# +# +# +# +# Scattering configuration as defined by the porto notation given by +# respective vectors. +# +# Vectors in the porto notation are defined as for A, B, C, D above. +# Linear light polarization is assumed. +# +# +# +# 3 x 4 Matrix, which lists the porto notation vectors A, B, C, D. +# A has to be perpendicular to B and C perpendicular to D. +# +# +# +# +# +# +# +# +# +# Specify the used light source. Multiple selection possible. +# +# +# +# +# +# +# +# +# +# +# +# +# This is the optical element used for the incident light in the Raman +# scattering process. +# +# This can be for example a simple lens or microscope +# objective. +# +# +# +# +# +# +# +# +# +# +# +# +# The numerical aperture of the used incident light optics. +# +# +# +# +# +# This is the optical element used for the incident light in the Raman +# scattering process. +# +# This can be for example a simple lens or microscope +# objective. +# +# +# +# +# +# +# +# +# +# +# +# +# +# The numerical aperture of the used incident light optics. +# +# +# +# +# +# Properties of the detector used. Integration time is the count time +# field, or the real time field. See their definition. +# +# +# +# +# Device for the manipulation of the state of light which is a half wave +# plate. +# +# +# +# +# +# +# +# +# +# +# +# +# +# Physical principle of the polarization filter used to create a +# defined incident or scattered light state. +# +# +# +# +# +# +# +# +# +# +# +# Specific name or type of the polarizer used. +# +# For example: Glan-Thompson, Glan-Taylor, Rochon Prism, Wollaston +# Polarizer... +# +# +# +# +# +# Type of laserline filter used to supress the laser, if measurements +# close to the laserline are performed. +# +# +# +# +# +# +# +# +# +# +# Design wavelength for the laser line filter. +# +# +# +# +# Steepness of the filter by normal incidence of the light as defined +# by 10% - 90% transmittance of the respective filter. +# +# +# +# +# +# Designed supression strength of the laserline at optimal condition +# given in orders of magnitude. +# +# +# +# +# +# Properties of the rotating element defined in +# 'instrument/rotating_element_type'. +# +# +# +# Define how many revolutions of the rotating element were averaged +# for each measurement. If the number of revolutions was fixed to a +# certain value use the field 'fixed_revolutions' instead. +# +# +# +# +# Define how many revolutions of the rotating element were taken +# into account for each measurement (if number of revolutions was +# fixed to a certain value, i.e. not averaged). +# +# +# +# +# Specify the maximum value of revolutions of the rotating element +# for each measurement. +# +# +# +# +# +# The spectroscope element of the ellipsometer before the detector, +# but often integrated to form one closed unit. Information on the +# dispersive element can be specified in the subfield GRATING. Note +# that different gratings might be used for different wavelength +# ranges. The dispersion of the grating for each wavelength range can +# be stored in grating_dispersion. +# +# +# +# +# +# +# +# Was the backside of the sample roughened? Relevant for infrared +# ellipsometry. +# +# +# +# +# +# +# Select which type of data was recorded, for example a simple spectrum +# with intensity vs. Raman shift, CCD image or a set of spectra with +# probe, reference and background signals for pump beam on and off. +# +# +# +# +# +# +# +# +# +#