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Add test functionality #7

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GoogleCodeExporter opened this issue May 9, 2015 · 1 comment
Open

Add test functionality #7

GoogleCodeExporter opened this issue May 9, 2015 · 1 comment
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auto-migrated enhancement Priority-Low

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Aside from the electrical test functionality, I should also add a test that 
writes a (possibly pseudorandom) pattern to the SIMM, reads it back, and checks 
to make sure it wrote correctly. It could also report errors like which chip(s) 
are not working correctly based on what it reads back.

Original issue reported on code.google.com by [email protected] on 16 May 2012 at 5:21
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Original comment by [email protected] on 20 May 2012 at 3:09

  • Added labels: Priority-Low

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@dougg3 @GoogleCodeExporter