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Add new application definition for PEEM experiments #147

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Add new application definition for PEEM experiments #147

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0f80727
Add new application definition for PEEM experiments
PeterC-DLS Sep 12, 2023
8ab05b8
Update mpes_peem definition
PeterC-DLS Sep 13, 2023
6853ab0
Update mpes_peem defintion
PeterC-DLS May 1, 2024
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202 changes: 202 additions & 0 deletions contributed_definitions/NXmpes_peem.nxdl.xml
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<?xml version='1.0' encoding='UTF-8'?>
<?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
<!--
# NeXus - Neutron and X-ray Common Data Format
#
# Copyright (C) 2014-2024 NeXus International Advisory Committee (NIAC)
#
# This library is free software; you can redistribute it and/or
# modify it under the terms of the GNU Lesser General Public
# License as published by the Free Software Foundation; either
# version 3 of the License, or (at your option) any later version.
#
# This library is distributed in the hope that it will be useful,
# but WITHOUT ANY WARRANTY; without even the implied warranty of
# MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
# Lesser General Public License for more details.
#
# You should have received a copy of the GNU Lesser General Public
# License along with this library; if not, write to the Free Software
# Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA
#
# For further information, see http://www.nexusformat.org
-->
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" name="NXmpes_peem" extends="NXmpes" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<doc>
This is a general application definition for a photo-electron emission or low
energy electron microscopy/diffraction experiment.
</doc>
<group type="NXentry">
<field name="definition">
<attribute name="version"/>
<enumeration>
<item value="NXmpes_peem"/>
</enumeration>
</field>
<group type="NXmonitor" recommended="true">
<doc>
contains field named in the **flux** attribute of :ref:`NXbeam`
</doc>
</group>
<group type="NXinstrument">
<group type="NXinsertion_device" optional="true"/>
<group type="NXmonochromator" recommended="true"/>
<group name="source_probe" type="NXsource" optional="true">
<field name="associated_beam" optional="true">
<enumeration>
<item value="beam_probe"/>
</enumeration>
</field>
</group>
<group name="beam_probe" type="NXbeam" optional="true">
<attribute name="flux"/>
<field name="incident_energy" type="NX_FLOAT" units="NX_ENERGY">
<doc>
this should be a link to monochromator energy
</doc>
</field>
<field name="incident_polarization_stokes" type="NX_NUMBER" recommended="true">
<doc>
use this or **incident_polarization**
</doc>
</field>
<field name="depends_on"/>
<group type="NXtransformations">
<field name="direction" type="NX_number" recommended="true">
<doc>
default is [0,0,1]
</doc>
</field>
<field name="reference_plane" type="NX_NUMBER" recommended="true">
<doc>
defined as normal to the plane used to measure azimuth. Default is [0,1,0]
through the origin
</doc>
</field>
</group>
</group>
<group type="NXoptical_system_em">
<field name="field_of_view" type="NX_FLOAT" units="NX_LENGTH">
<doc>
One or two values for size of image on sample or in another space along slow and
fast pixel dimensions.
</doc>
</field>
<field name="working_distance" type="NX_FLOAT" units="NX_LENGTH"/>
<field name="magnification" type="NX_FLOAT"/>
</group>
<group type="NXelectronanalyser">
<group type="NXcollectioncolumn">
<field name="scheme">
<doc>
Scheme of the electron collection column.
</doc>
<enumeration>
<item value="standard"/>
<item value="angular dispersive"/>
<item value="selective area"/>
<item value="deflector"/>
<item value="PEEM"/>
<item value="PEEM dark-field"/>
<item value="LEEM"/>
<item value="LEEM dark-field"/>
<item value="LEED"/>
<item value="dispersive plane"/>
<item value="momentum microscope"/>
</enumeration>
</field>
<field name="projection">
<doc>
The space projected in the angularly dispersive direction
</doc>
<enumeration>
<item value="real"/>
<item value="reciprocal"/>
<item value="energy"/>
</enumeration>
</field>
<field name="extractor_voltage" type="NX_FLOAT" units="NX_VOLTAGE"/>
<group name="objective_lens" type="NXlens_em">
<doc>
list of electromagnetic lenses of the microscope column.
</doc>
</group>
</group>
<!--other EM lenses in column-->
<group name="electron_gun" type="NXebeam_column" optional="true">
<group name="field_aperture" type="NXaperture_em"/>
<group name="beam" type="NXbeam"/>
</group>
<group type="NXenergydispersion" optional="true">
<field name="energy_interval" type="NX_FLOAT" optional="true" units="NX_ENERGY">
<doc>
only in dispersive mode
</doc>
</field>
<field name="center_energy" type="NX_FLOAT" optional="true" units="NX_ENERGY">
<doc>
Center of the energy window (only in dispersive mode)
</doc>
</field>
</group>
<group type="NXdetector">
<field name="depends_on"/>
<group name="transformations" type="NXtransformations">
<doc>
Virtual transformations to sample that map the pixels onto sample coordinates.
</doc>
</group>
<group type="NXdetector_module">
<doc>
For detectors with irregular pixel sizes or composed by modules tiled together.
</doc>
</group>
<field name="dark_image" type="NX_NUMBER">
<doc>
external link to a dark image.
</doc>
</field>
<field name="flatfield_image" type="NX_NUMBER">
<doc>
external link to a flat field image.
</doc>
</field>
<field name="data" type="NX_NUMBER"/>
</group>
<group type="NXmanipulator">
<doc>
Manipulator for positioning and rotating of the sample.
</doc>
<group type="NXpositioner">
<doc>
One of a group of sample positioners
</doc>
</group>
<!--other NXpositioners-->
<field name="sample_bias" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Start voltage (sample retarding potential).
</doc>
</field>
</group>
</group>
</group>
<group name="geometries" type="NXcoordinate_system_set">
<doc>
Collection of useful coordinate system. The common reference system should be
the sample with all the positioner set to zero. Define at least the beam
reference at sample position and the gravity direction. Add the crystal cell
orientation if necessary.
</doc>
</group>
<group type="NXsample">
<field name="depends_on"/>
<group type="NXtransformations">
<doc>
The origin is at the sample position in the center of the detector field of
view, with all the manipulator positioners set to zero.
</doc>
</group>
</group>
</group>
</definition>
118 changes: 118 additions & 0 deletions contributed_definitions/nyaml/NXmpes_peem.yaml
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doc: |
This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment.
category: application
NXmpes_peem(NXmpes):
(NXentry):
definition:
\@version:
enumeration: [NXmpes_peem]
(NXmonitor):
exists: recommended
doc: contains field named in the **flux** attribute of :ref:`NXbeam`
(NXinstrument):
(NXinsertion_device):
exists: optional # only when PEEM uses synchrotron light
(NXmonochromator): # incoming_beam_monochromator
exists: recommended
source_probe(NXsource):
exists: optional # only when PEEM uses synchrotron light
associated_beam:
exists: optional # only when PEEM uses synchrotron light
enumeration: [beam_probe]
beam_probe(NXbeam):
exists: optional # as we record it in NXsample
\@flux: # that will point to the NXmonitor data field
incident_energy(NX_FLOAT):
unit: NX_ENERGY
doc: this should be a link to monochromator energy
incident_polarization_stokes(NX_NUMBER):
exists: recommended
doc: use this or **incident_polarization**
depends_on:
(NXtransformations):
direction(NX_number):
exists: recommended
doc:
default is [0,0,1]
reference_plane(NX_NUMBER): #how is that for our AC-PEEM?
exists: recommended
doc:
defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin
(NXoptical_system_em):
field_of_view(NX_FLOAT):
unit: NX_LENGTH
doc:
One or two values for size of image on sample or in another space along slow and fast pixel dimensions.
working_distance(NX_FLOAT):
unit: NX_LENGTH
magnification(NX_FLOAT):
(NXelectronanalyser):
(NXcollectioncolumn): # supplement base application definition
scheme:
doc: |
Scheme of the electron collection column.
enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope]
projection:
doc:
The space projected in the angularly dispersive direction
enumeration: [real, reciprocal, energy]
extractor_voltage(NX_FLOAT):
unit: NX_VOLTAGE
objective_lens(NXlens_em):
doc:
list of electromagnetic lenses of the microscope column.
# other EM lenses in column
electron_gun(NXebeam_column):
exists: optional # when doing LEEM/LEED
field_aperture(NXaperture_em):
beam(NXbeam):
(NXenergydispersion):
exists: optional
energy_interval(NX_FLOAT):
exists: optional
unit: NX_ENERGY
doc:
only in dispersive mode
center_energy(NX_FLOAT):
exists: optional
unit: NX_ENERGY
doc:
Center of the energy window (only in dispersive mode)
(NXdetector):
depends_on:
transformations(NXtransformations):
doc:
Virtual transformations to sample that map the pixels onto sample coordinates.
(NXdetector_module):
doc:
For detectors with irregular pixel sizes or composed by modules tiled together.
dark_image(NX_NUMBER):
doc:
external link to a dark image.
flatfield_image(NX_NUMBER):
doc:
external link to a flat field image.
data(NX_NUMBER):
(NXmanipulator):
doc:
Manipulator for positioning and rotating of the sample.
(NXpositioner):
doc:
One of a group of sample positioners
# other NXpositioners
sample_bias(NX_FLOAT):
unit: NX_VOLTAGE
doc:
Start voltage (sample retarding potential).
geometries(NXcoordinate_system_set):
doc:
Collection of useful coordinate system. The common reference system should
be the sample with all the positioner set to zero. Define at least the beam
reference at sample position and the gravity direction.
Add the crystal cell orientation if necessary.
(NXsample):
depends_on:
(NXtransformations): # links to fields in NXmanipulator
doc:
The origin is at the sample position in the center of the detector field of view,
with all the manipulator positioners set to zero.